Model: iEDX 150WT
Features:
- Plating thickness measurement : General, Rh, Pd, Au, Ag, Sn, Ni.
- Film thickness measurement of multilayer thin films (up to 5 Layer).
- Energy Resolution of SDD : 125eV FWHM at Mn Kα.
- Optional: Energy Resolution of Fast SDD : 120eV FWHM at Mn Kα.
- Multi Collimator (Options : 0.05, 0.1, 0.2, 0.3, 1mm)
- Auto Stage mode.
- Optional RoHS screeing.
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